In materials studies, atomic force microscopy (AFM) is one of the standard tools to characterize the surface of a material. Most of the time people use it to acquire a topographic image to access the surface morphologies. The development of the AFM technique is, however, still active and in the emerging phase (AFM was invented in 1986). At the heart of AFM, the probe plays a key role.
Here’s a collection of talks that probe the design of the AFM probe in the joint Spring/Fall MRS:
F.MT02.03.03 Paddled Cantilever for AFM Beyond Topography by Dr. Hanna Cho from the Ohio State University
Cho group addresses the issue of artifacts that’s often accompanied by AFM measurements. By introducing a second micro-cantilever on the AFM probe, they demonstrate a great improvement of the artifacts and therefore help interpret the AFM images.
F.MT02.04.01 Conductive Colloidal Scanning Probe Microscopy by Dr. Christine Kranz from Ulm University
Kranz group focuses on developing colloidal probe technique that makes simultaneously physical and electrochemical mapping available.
Note: The list is not exhaustive and if you find relevant sessions, please let me know and I’d love to update the list!
To connect with Chiung-Wei: @cwhuang_sci